Monitor semiconductor reliability data and get AI-flagged alerts

flowchart TD trig(["scheduled reliability data review"]):::trigtime s0["Pull capacity and sensor data"]:::task s1["Merge findings by severity"]:::task s2["Send alerts and reports"]:::svc trig --> s0 s1 --> s2 gx{"+ what risks to assess"}:::gate s0 --> gx p00["Assess thermal stress risk"]:::task gx -->|"Thermal stress"| p00 p10["Assess material risk"]:::task gx -->|"Material risk"| p10 p20["Assess performance deviations"]:::task gx -->|"Performance deviation"| p20 jn{"+ Merge findings"}:::gate p00 --> jn p10 --> jn p20 --> jn jn --> s1 out[/"severity-classified reliability alerts"/]:::out pay{{"catch failure risk before it happens"}}:::pay s2 --> out out --> pay classDef task fill:#e7f6fe,stroke:#34b8f0,color:#2c2a29 classDef svc fill:#f6f8fa,stroke:#7c8795,color:#2c2a29 classDef mi fill:#e7f6fe,stroke:#0079a8,color:#2c2a29,stroke-width:2px classDef human fill:#fff,stroke:#0079a8,color:#0079a8 classDef store fill:#f6f8fa,stroke:#0079a8,color:#2c2a29 classDef trig fill:#00a4eb,stroke:#0079a8,color:#fff,font-weight:bold classDef trigtime fill:#00a4eb,stroke:#0079a8,color:#fff,font-weight:bold classDef trigdata fill:#8ad4f5,stroke:#0079a8,color:#06314c,font-weight:bold classDef gate fill:#fff,stroke:#e8a23d,color:#6b4708,font-weight:bold classDef out fill:#1f9d6b,stroke:#167a53,color:#fff,font-weight:bold classDef pay fill:#06314c,stroke:#021f33,color:#fff